Testing ADCs for Static and Dynamic Nonlinearities —Killing two birds with one stone—

نویسندگان

  • Carsten Wegener
  • Michael Peter Kennedy
چکیده

Traditionally, static linearity and dynamic distortion tests are performed separately for ADCs. To this end, a low-frequency sinewave is histogrammed to measure static Integral Nonlinearity, and a high-frequency sine-wave is sampled for FFT processing to measure dynamic distortions and dynamic range. We propose to use a model-based technique to extract both static and dynamic nonlinearities from a single data record of a sampled high-frequency sine-wave. This saves test time as the ADC converts fewer samples.

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تاریخ انتشار 2002